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Analog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standard
Osseiran, Adam
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| 자료유형 | 단행본 |
|---|---|
| 서명/저자사항 | Analog and mixed-signal boundary-scan: a guide to the IEEE 1149.4 test standard/: edited by Adam Osseiran. |
| 개인저자 | Osseiran, Adam. |
| 발행사항 | Massachusetts: Kluwer Academic Publishers, 1999. |
| 형태사항 | xviii, 155 p.: Illustrations; 24 cm. |
| 총서사항 | Frontiers in electronic testing |
| ISBN | 0792386868 |
| 서지주기 | Includes bibliographical references and index.Includes indexs |
| 일반주제명 | Printed circuits --Testing --Standards. Boundary scan testing. Mixed signal circuits --Testing. Electronic digital computers --Circuits --Design and construction. |
| 분류기호 | 621.381548 |
| 언어 | 영어 |
